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We have developed wavelet-based methods for statistically optimal
solution to inverse scattering problems that produce reconstructions at
multiple resolutions and allow us to identify the optimal scale of
reconstruction at each point in the image frame. The approach is
computationally efficient and also provides the basis for
decision-directed multiresolution anomaly detection, localization, and
characterization, a scale-recursive procedure for identifying regions of
interest and zooming in on these in detail.
Tuan Cao-Huu
2002-07-27